Transmission Electron Microscope (TEM)

JEOL JEM-3011

 

The instrument is installed with a LaB6 emitter and it operates at an accelerating voltage of 300kV. Apart from the normal bright-field imaging (BF), it is also capable of performing dark-field imaging (DF), selected area electron diffraction (SAED) and lattice imaging. This system is equipped with an Oxford Instruments INCA x-sight Energy Dispersive Spectrometer (EDS) and a Gatan Orius SC200 CCD camera as well.