Electron microscopy analysis offers observation of the morphology or topography of a specimen at high magnifications. Compositional analysis of multi-phase material or novel compounds can be obtained. Characterisation of fine particulate matter in terms of size, shape and distribution as well as statistical analyses of the parameters are performed. It is applied to micro-area elemental analysis and electron diffraction, observation of atomic rays and micro-structural studies of fine particle composites and nano-structured materials.
JEOL JSM-5200 Scanning Electron Microscope (SEM) equipped with a magnetron sputtering auto fine platinum coater with magnification from 35 to 20 000 times.
All requests outside of NUS Department of Chemistry for analysis should be sent via firstname.lastname@example.org.